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Showing 8 out of a total of 8 results for collection: Fakultät für Mathematik und Physik.
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Flux-quantum-modulated Kondo conductance in a multielectron quantum dot
Fühner, C.
;
Keyser, U.F.
;
Haug, Rolf J.
;
Reuter, D.
;
Wieck, A.D.
(
College Park, MD : American Physical Society
,
2002
)
Fabrication of a single-electron transistor by current-controlled local oxidation of a two-dimensional electron system
Keyser, U.F.
;
Schumacher, Hans W.
;
Zeitler, U.
;
Haug, Rolf J.
;
Eberl, K.
(
College Park, MD : American Institute of Physics
,
2000
)
Combined atomic force microscope and electron-beam lithography used for the fabrication of variable-coupling quantum dots
Rogge, M.C.
;
Fühner, C.
;
Keyser, U.F.
;
Haug, Rolf J.
;
Bichler, M.
;
Abstreiter, G.
;
Wegscheider, W.
(
College Park, MD : American Institute of Physics
,
2003
)
Fabrication of quantum point contacts by engraving GaAs/AlGaAs heterostructures with a diamond tip
Regul, J.
;
Keyser, U.F.
;
Paesler, M.
;
Hohls, Frank
;
Zeitler, U.
;
Haug, Rolf J.
;
Malavé, A.
;
Oesterschulze, E.
;
Reuter, D.
;
Wieck, A.D.
(
College Park, MD : American Institute of Physics
,
2002
)
Spin blockade in capacitively coupled quantum dots
Rogge, M.C.
;
Fühner, C.
;
Keyser, U.F.
;
Haug, Rolf J.
(
College Park, MD : American Institute of Physics
,
2004
)
Tuning the onset voltage of resonant tunneling through InAs quantum dots by growth parameters
Hapke-Wurst, I.
;
Zeitler, U.
;
Keyser, U.F.
;
Haug, Rolf J.
;
Pierz, Klaus
;
Ma, Z.
(
College Park, MD : American Institute of Physics
,
2003
)
Nanomachining of mesoscopic electronic devices using an atomic force microscope
Schumacher, Hans W.
;
Keyser, U.F.
;
Zeitler, U.
;
Haug, Rolf J.
;
Eberl, K.
(
College Park, MD : American Institute of Physics
,
1999
)
Kondo effect in a few-electron quantum ring
Keyser, U.F.
;
Fühner, C.
;
Borck, S.
;
Haug, Rolf J.
;
Bichler, M.
;
Abstreiter, G.
;
Wegscheider, W.
(
College Park, MD : American Physical Society
,
2003
)
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Usage Statistics
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Discover
Author
Haug, Rolf J. (8)
Keyser, U.F. (8)
Fühner, C. (4)
Zeitler, U. (4)
Abstreiter, G. (2)
Bichler, M. (2)
Eberl, K. (2)
Reuter, D. (2)
Rogge, M.C. (2)
Schumacher, Hans W. (2)
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Subject
Atomic force microscopy (5)
Semiconductor quantum dots (3)
Anodic oxidation (2)
Electron beam lithography (2)
Ground state (2)
Heterojunctions (2)
Magnetic fields (2)
Oscillations (2)
2DEG (1)
AFM (1)
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Date Issued
2004 (1)
2003 (3)
2002 (2)
2000 (1)
1999 (1)
Language (ISO)
eng (8)