Rogge, M.C.; Fühner, C.; Keyser, U.F.; Haug, R.J.; Bichler, M. et al.: Combined atomic force microscope and electron-beam lithography used for the fabrication of variable-coupling quantum dots. In: Applied Physics Letters 83 (2003), Nr. 6, S. 1163-1165. DOI:
https://doi.org/10.1063/1.1599972