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Combined atomic force microscope and electron-beam lithography used for the fabrication of variable-coupling quantum dots
Rogge, M.C.
;
Fühner, C.
;
Keyser, U.F.
;
Haug, Rolf J.
;
Bichler, M.
;
Abstreiter, G.
;
Wegscheider, W.
(
College Park, MD : American Institute of Physics
,
2003
)
Spin blockade in capacitively coupled quantum dots
Rogge, M.C.
;
Fühner, C.
;
Keyser, U.F.
;
Haug, Rolf J.
(
College Park, MD : American Institute of Physics
,
2004
)
Tuning the onset voltage of resonant tunneling through InAs quantum dots by growth parameters
Hapke-Wurst, I.
;
Zeitler, U.
;
Keyser, U.F.
;
Haug, Rolf J.
;
Pierz, Klaus
;
Ma, Z.
(
College Park, MD : American Institute of Physics
,
2003
)
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Usage Statistics
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Author
Haug, Rolf J. (3)
Keyser, U.F. (3)
Fühner, C. (2)
Rogge, M.C. (2)
Abstreiter, G. (1)
Bichler, M. (1)
Hapke-Wurst, I. (1)
Ma, Z. (1)
Pierz, Klaus (1)
Wegscheider, W. (1)
... View More
Subject
Atomic force microscopy (3)
Semiconductor quantum dots (3)
Anodic oxidation (2)
Electron beam lithography (2)
Binding energy (1)
Capacitive couplings (1)
Coupled quantum dots (1)
Current voltage characteristics (1)
Electric conductivity (1)
Electron transitions (1)
... View More
Date Issued
2004 (1)
2003 (2)
Language (ISO)
eng (3)