Schinke, Carsten; Peest, Peter Christian; Schmidt, Jan; Brendel, Rolf; Bothe, Karsten; Vogt, Malte R. et al.: Uncertainty analysis for the coefficient of band-to-band absorption of crystalline silicon. In: AIP Advances 5 (2015), Nr. 6. DOI:
http://dx.doi.org/10.1063/1.4923379
Abstract: |
Metallic Zn nanodisks with hexagonal morphology were obtained onto glass substrate under vacuum thermal evaporation. A thermal characterization of Zn nanodiks showed a lower oxidation temperature than source powder Zn. Different thermal treatment on Zn nanodisks played an important role on the morphology, crystal size and surface vibrational modes of ZnO. The growth of ZnO nanoneedles started at the edge of metallic zinc hexagonal structures according with SEM images, the higher temperature the longer needles were grown. XRD diffractogram confirmed the wurtzite structure of ZnO with metallic nuclei. A wide band between 530 and 580 cm(-1) of Raman scattering corresponded at surface vibrational modes not observed at higher temperature.
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License of this version: |
CC BY 3.0 Unported - http://creativecommons.org/licenses/by/3.0/
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Publication type: |
Article |
Publishing status: |
publishedVersion |
Publication date: |
2015 |
Keywords german: |
kristallines Silizium, c-Si, Silizium, Absorptionskoeffizient, Fehleranalyse, Solarzelle, Photovoltaikzelle, Photolumineszenz, Fotolumineszenz, Photovoltaik
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Keywords english: |
crystalline silicon, silicon, absorption coefficient, error analysis, solar cells, photoluminescence, Photovoltaic
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DDC: |
530 | Physik
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Controlled keywords(GND): |
Silicium, Absorptionskoeffizient, Fehleranalyse, Solarzelle, Photolumineszenz, Fotovoltaik
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