A compact high-resolution X-ray ion mobility spectrometer

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dc.identifier.uri http://dx.doi.org/10.15488/4413
dc.identifier.uri https://www.repo.uni-hannover.de/handle/123456789/4453
dc.contributor.author Reinecke, Tobias ger
dc.contributor.author Kirk, Ansgar T. ger
dc.contributor.author Heptner, Andre ger
dc.contributor.author Niebuhr, D. ger
dc.contributor.author Böttger, S. ger
dc.contributor.author Zimmermann, Stefan ger
dc.date.accessioned 2019-01-25T10:26:48Z
dc.date.available 2019-01-25T10:26:48Z
dc.date.issued 2016
dc.identifier.citation Reinecke, T.; Kirk, A.T.; Heptner, A.; Niebuhr, D.; Böttger, S.; Zimmermann, S.: A compact high-resolution X-ray ion mobility spectrometer. In: Review of Scientific Instruments 87 (2016), 053120. DOI: https://doi.org/10.1063/1.4950866 ger
dc.description.abstract For the ionization of gaseous samples, most ion mobility spectrometers employ radioactive ionization sources, e.g., containing 63Ni or 3H. Besides legal restrictions, radioactive materials have the disadvantage of a constant radiation with predetermined intensity. In this work, we replaced the 3H source of our previously described high-resolution ion mobility spectrometer with 75 mm drift tube length with a commercially available X-ray source. It is shown that the current configuration maintains the resolving power of R = 100 which was reported for the original setup containing a 3H source. The main advantage of an X-ray source is that the intensity of the radiation can be adjusted by varying its operating parameters, i.e., filament current and acceleration voltage. At the expense of reduced resolving power, the sensitivity of the setup can be increased by increasing the activity of the source. Therefore, the performance of the setup can be adjusted to the specific requirements of any application. To investigate the relation between operating parameters of the X-Ray source and the performance of the ion mobility spectrometer, parametric studies of filament current and acceleration voltage are performed and the influence on resolving power, peak height, and noise is analyzed. ger
dc.language.iso eng ger
dc.publisher College Park, MA : American Institute of Physics (AIP)
dc.relation.ispartofseries Review of Scientific Instruments 87 (2016) ger
dc.rights Es gilt deutsches Urheberrecht. Das Dokument darf zum eigenen Gebrauch kostenfrei genutzt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden. ger
dc.subject Photoionization eng
dc.subject Polymers eng
dc.subject Plasmas eng
dc.subject Detection limit eng
dc.subject Ion sources eng
dc.subject Gas discharges eng
dc.subject Transition metals eng
dc.subject Signal processing eng
dc.subject Radioactive material eng
dc.subject X-ray spectroscopy eng
dc.subject.ddc 621,3 | Elektrotechnik, Elektronik ger
dc.subject.ddc 530 | Physik ger
dc.title A compact high-resolution X-ray ion mobility spectrometer eng
dc.type article ger
dc.type Text ger
dc.relation.doi 10.1063/1.4950866
dc.description.version publishedVersion ger
tib.accessRights frei zug�nglich ger

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