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Usage of the contactless vector network analysis with varying transmission line geometries
Zelder, T.
;
Geck, B.
;
Rolfes, I.
;
Eul, H.
(
Göttingen : Copernicus GmbH
,
2008
)
Methods for the calibrated measurement of the scattering parameters of planar multi-port devices
Rolfes, I.
;
Schiek, B.
(
Göttingen : Copernicus GmbH
,
2007
)
Obstacle-based self-calibration techniques for the determination of the permittivity of liquids
Rolfes, I.
(
Göttingen : Copernicus GmbH
,
2007
)
Calibration-measurement unit for the automation of vector network analyzer measurements
Rolfes, I.
;
Will, B.
;
Schiek, B.
(
Göttingen : Copernicus GmbH
,
2008
)
Contactless vector network analysis using diversity calibration with capacitive and inductive coupled probes
Zelder, T.
;
Rolfes, I.
;
Eul, H.
(
Göttingen : Copernicus GmbH
,
2007
)
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Author
Rolfes, I. (3)
Eul, H. (2)
Rolfes, I. (2)
Schiek, B. (2)
Zelder, T. (2)
Geck, B. (1)
Will, B. (1)
Subject
Calibration (5)
Scattering parameters (4)
Vector network analyzers (3)
Complex scattering parameters (2)
Design for testability (2)
Device under test (2)
Embedded device (2)
Measurement setup (2)
Measurement system (2)
Self-calibration procedures (2)
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Date Issued
2008 (2)
2007 (3)
Language (ISO)
eng (5)