With the availability of multi-port vector network analyzers, the need for automated, calibrated measurement facilities increases. In this contribution, a calibrationmeasurement unit is presented which realizes a repeatable ...

Contactless vector network analysis based on a diversity calibration is investigated for the measurement of embedded devices in planar circuits. Conventional contactless measurement systems based on two probes for each ...

In this article, the error-corrected determination of complex scattering parameters of multi-port devices by means of a 2-port vector network analyzer is presented. As only two ports of the device under test can be connected ...

Scanning electron microscopes (SEMs) are versatile imaging devices for the micro-and nanoscale that find application in various disciplines such as the characterization of biological, mineral or mechanical specimen. Even ...

The scattering parameters of embedded devices can be measured by means of contactless vector network analysis. To achieve accurate measurement results, the contactless measurement setup has to be calibrated. However, if ...