Schmidt, H.; Smirnov, D.; Rode, J.; Haug, R.J.: Multi-terminal magnetotransport measurements over a tunable graphene p-n junction created by AFM-nanomachining. In: AIP Conference Proceedings 1566 (2013), S. 175-176. DOI:
https://doi.org/10.1063/1.4848342
Abstract: |
An Atomic Force Microscope is used to alter one part of a single layer graphene sample locally. Transport experiments at low temperatures are then used to characterize the different parts independently with field effect and Hall measurements. It is shown, that the nanomachining leads to an effective doping in the altered area and therefore to a difference in the charge carrier density of Δn = 3.5·1015m-2 between the unchanged and changed part. These two parts can be tuned with a global backgate to form a junction of different polarity, i.e. a p-n junction. © 2013 AIP Publishing LLC.
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License of this version: |
Es gilt deutsches Urheberrecht. Das Dokument darf zum eigenen Gebrauch kostenfrei genutzt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden. |
Publication type: |
Article |
Publishing status: |
publishedVersion |
Publication date: |
2013 |
Keywords english: |
AFM, bipolar, Graphene, Atomic force microscopy, Graphene, Semiconductor junctions, AFM, bipolar, Effective doping, Graphene p-n junctions, Hall measurements, Low temperatures, Magneto-transport measurement, Transport experiments, Semiconductor doping
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DDC: |
530 | Physik
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Controlled keywords(GND): |
Konferenzschrift
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