- Home
- →
- Fakultäten
- →
- Fakultät für Mathematik und Physik
- →
- View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.
Original version
Liu, Y.; Tschuch, S.; Rudenko, A.; Dürr, M.; Siegel, M. et al.: Strong-field double ionization of Ar below the recollision threshold. In: Physical Review Letters 101 (2008), Nr. 5, 53001. DOI: https://doi.org/10.1103/PhysRevLett.101.053001
Repository version
To cite the version in the repository, please use this identifier:
https://doi.org/10.15488/3296
Files in this item
| Abstract: | |
|
Nonsequential double ionization of Ar by 45 fs laser pulses (800 nm) at (4-7)×1013W/cm2 was explored in fully differential measurements. Well below the field-modified recollision threshold we enter the multiphoton regime. Strongly correlated back-to-back emission of the electrons along the polarization direction is observed to dominate in striking contrast to all previous data. No effect of Coulomb repulsion can be found, the predicted cutoff in the sum-energy spectra of two emitted electrons is confirmed, and the potential importance of multiple recollisions is discussed. © 2008 The American Physical Society.
|
|
| License of this version: | Es gilt deutsches Urheberrecht. Das Dokument darf zum eigenen Gebrauch kostenfrei genutzt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden. |
| Publication type: | Article |
| Publishing status: | publishedVersion |
| Publication date: | 2008 |
| Keywords english: | Atoms, Emission spectroscopy, Ionization, Ionization of gases, Laser pulses, Pulsed laser applications, Coulomb repulsions, Double ionization, En ergy spectrum, Fs laser pulses, Fully differential, Multiphoton regimes, Nonsequential double ionization, Polarization directions, Recollision, Argon |
| DDC: | 530 | Physik |
This item appears in the following Collection(s):
-
Fakultät für Mathematik und Physik
Frei zugängliche Publikationen aus der Fakultät für Mathematik und Physik