Estimation of the threat of IEMI to complex electronic systems

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dc.identifier.uri Kanyou Nana, R. Korte, S. Dickmann, S. Garbe, Heyno Sabath, F. 2017-05-31T07:43:53Z 2017-05-31T07:43:53Z 2009
dc.identifier.citation Kanyou, Nana, R.; Korte, S.; Dickmann, S.; Garbe, Heyno; Sabath, F.: Estimation of the threat of IEMI to complex electronic systems. In: Advances in Radio Science 7 (2009), S. 249-253. DOI:
dc.description.abstract The threat of ultra wideband (UWB) sources is interesting for military issues. This paper summarizes information concerning the voltages generated from some commercially available UWB generator systems and their produced electromagnetic fields. The paper focuses on the coupling of UWB fields into electronic equipment and discusses possible modeling and measurement techniques to estimate such a threat for modern ships. An evaluation procedure for the determination of the induced voltage at the input of an electronic component is presented. This method is based on the computation of the internal electric field and the measurements on a test network, which is similar to the structure of the steering control cabling. It allows the estimation of the potential threat for the ship's electronic equipment due to the exposal to UWB emitting sources. eng
dc.description.sponsorship Bundesamt für Wehrtechnik und Beschaffung
dc.language.iso eng
dc.publisher Göttingen : Copernicus GmbH
dc.relation.ispartofseries Advances in Radio Science 7 (2009)
dc.rights CC BY 3.0 Unported
dc.subject Complex electronic systems eng
dc.subject Electronic component eng
dc.subject Emitting sources eng
dc.subject Generator systems eng
dc.subject Information concerning eng
dc.subject Internal electric fields eng
dc.subject Modeling and measurement eng
dc.subject Potential threats eng
dc.subject Complex networks eng
dc.subject Electric fields eng
dc.subject Electromagnetic fields eng
dc.subject Estimation eng
dc.subject Ships eng
dc.subject Ultra-wideband (UWB) eng
dc.subject.ddc 621,3 | Elektrotechnik, Elektronik ger
dc.title Estimation of the threat of IEMI to complex electronic systems
dc.type article
dc.type Text
dc.relation.issn 1684-9965
dc.bibliographicCitation.volume 7
dc.bibliographicCitation.firstPage 249
dc.bibliographicCitation.lastPage 253
dc.description.version publishedVersion
tib.accessRights frei zug�nglich

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