dc.identifier.uri |
https://www.repo.uni-hannover.de/handle/123456789/13804 |
|
dc.identifier.uri |
https://doi.org/10.15488/13694 |
|
dc.contributor.author |
Webering, Fritz
|
|
dc.contributor.author |
Payá Vayá, Guillermo
|
|
dc.contributor.author |
Aditya, Evan
|
|
dc.contributor.author |
Dürre, Jan Christoph
|
|
dc.contributor.author |
Blume, Holger Christoph
|
|
dc.date.accessioned |
2023-05-16T13:58:01Z |
|
dc.date.available |
2023-05-16T13:58:01Z |
|
dc.date.issued |
2017 |
|
dc.identifier.citation |
Webering, F.; Payá Vayá, G.; Aditya, E.; Dürre, J.C.; Blume, H.C.: An Integrated Heated Testbench for Characterizing High Temperature ICs. In: ICT.OPEN Proceedings 2017. Dutch Research Council (NWO) : Den Haag, 2017, 5 S. |
|
dc.description.abstract |
This paper presents a newly developed integrated
heating system, which can keep the IC under test at a constant
temperature of up to 250 ◦C. The heating system can be used
while the IC under test is mounted on its custom-designed
interface board, which controls the two supply voltages and
provides connectivity to an FPGA. Using a testing framework on
the FPGA, the test stimuli and operating clock can be provided
with at least 100 MHz. Thus, it is possible to fully vary all
three parameters—frequency, voltage, and temperature—during
continuous operation of the IC. A case study is performed with
a previously fabricated ASIC to test the proposed system. |
eng |
dc.language.iso |
eng |
|
dc.publisher |
Dutch Research Council (NWO) : Den Haag |
|
dc.relation.ispartof |
ICT.OPEN Proceedings 2017 |
|
dc.relation.uri |
http://www.ictopen.nl/binaries/content/assets/bestanden/ict-open-2017/proceedings2017/webering.pdf |
|
dc.rights |
Es gilt deutsches Urheberrecht. Das Dokument darf zum eigenen Gebrauch kostenfrei genutzt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden. |
|
dc.subject.classification |
Konferenzschrift |
ger |
dc.subject.ddc |
621,3 | Elektrotechnik, Elektronik
|
|
dc.title |
An Integrated Heated Testbench for Characterizing High Temperature ICs |
eng |
dc.type |
BookPart |
|
dc.type |
Text |
|
dc.relation.isbn |
978-94-92579-027 |
|
dcterms.extent |
5 S. |
|
dc.description.version |
publishedVersion |
eng |
tib.accessRights |
frei zug�nglich |
|