Noise measurement of a quantized charge pump

Maire, Niels; Hohls, Frank; Kaestner, Bernd; Pierz, Klaus; Schumacher, Hans W.; Haug, Rolf J.

Original version

Maire, N.; Hohls, F.; Kaestner, B.; Pierz, K.; Schumacher, H.W.; Haug, R.J.: Noise measurement of a quantized charge pump. In: Applied Physics Letters 92 (2008), Nr. 8, 82112. DOI: https://doi.org/10.1063/1.2885076

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To cite the version in the repository, please use this identifier: https://doi.org/10.15488/2836

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Abstract:
We study the noise properties of a gate controlled single electron pump at a driving frequency fp =400 MHz. We observe a significant reduction of the noise power on the current plateaus. This is a strong indication for true quantized charge pumping. We furthermore observe a small level of low frequency fluctuations which indicates a good frequency stability of the pump. © 2008 American Institute of Physics.
License of this version:	Es gilt deutsches Urheberrecht. Das Dokument darf zum eigenen Gebrauch kostenfrei genutzt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden.
Publication type:	Article
Publishing status:	publishedVersion
Publication date:	2008
Keywords english:	Frequency bands, Frequency stability, Charge pumping, Electron pump, Noise power, Electrons
DDC:	530 \| Physik