- Home
- →
- Fakultäten
- →
- Fakultät für Mathematik und Physik
- →
- View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.
Original version
Schlichting, S.; Willemsen, T.; Ehlers, H.; Morgner, U.; Ristau, D.: Direct in situ GDD measurement in optical coating process. In: Proceedings of SPIE - The International Society for Optical Engineering 9627 (2015), 96271S. DOI: https://doi.org/10.1117/12.2191215
Repository version
To cite the version in the repository, please use this identifier:
https://doi.org/10.15488/1756
Files in this item
| Abstract: | |
|
In the presented work a fast frequency domain measurement system to determine group delay (GD) and group delay dispersion (GDD) of optical coatings is proposed. The measurements are performed in situ directly on moving substrates during the thin film coating process. The method is based on a Michelson interferometer, which is equipped with a high power broad band light source and a fast spectrometer. Especially for the production of chirped mirrors it is advantageous to obtain group delay and group delay dispersion data of the last layers. This additional information allows for online corrections of coating errors to enhance the precision of complex interference filters for short pulse applications. © 2015 SPIE.
|
|
| License of this version: | Es gilt deutsches Urheberrecht. Das Dokument darf zum eigenen Gebrauch kostenfrei genutzt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden. Dieser Beitrag ist aufgrund einer (DFG-geförderten) Allianz- bzw. Nationallizenz frei zugänglich. |
| Publication type: | BookPart |
| Publishing status: | publishedVersion |
| Publication date: | 2015 |
| Keywords english: | chirped mirrors, FTSI, GD, GDD, in situ measurement, optical coatings, optical thin films, STFT, Coatings, Dispersions, Frequency domain analysis, Gadolinium, Group delay, Laser mirrors, Light sources, Michelson interferometers, Mirrors, Optical coatings, Systems analysis, Thin films, Ultrashort pulses, Chirped mirrors, FTSI, In-situ measurement, Optical thin films, STFT, Optical films |
| DDC: | 530 | Physik |
| Controlled keywords(GND): | Konferenzschrift |
This item appears in the following Collection(s):
-
Fakultät für Mathematik und Physik
Frei zugängliche Publikationen aus der Fakultät für Mathematik und Physik