Langer, Thomas; Baringhaus, Jens; Pfnür, Herbert; Schumacher, H.W.; Tegenkamp, Christoph
(Bristol : IOP Publishing Ltd., 2010)
The sheet plasmon in epitaxially grown graphene layers on SiC(0001) and the influence of surface roughness have been investigated in detail by means of low-energy electron diffraction (LEED) and electron energy loss ...