Browsing Fakultät für Mathematik und Physik by Subject "X ray diffraction analysis"

Browsing Fakultät für Mathematik und Physik by Subject "X ray diffraction analysis"

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  • Graphitization process of SiC(0001) studied by electron energy loss spectroscopy 
    Langer, T.; Pfnür, Herbert; Schumacher, H.W.; Tegenkamp, Christoph (College Park, MD : American Institute of Physics, 2009)
    Electron energy loss spectroscopy (EELS) is used to study the transition from the buffer layer to the first graphene layers during graphitization of SiC(0001). Graphene growth is controlled and correlated with spot profile ...
  • Kerfless exfoliated thin crystalline Si wafers with Al metallization layers for solar cells 
    Niepelt, Raphael; Hensen, Jan; Steckenreiter, Verena; Brendel, Rolf; Kajari-Schröder, Sarah (Cambridge : Cambridge University Press, 2015)
    We report on a kerfless exfoliation approach to further reduce the costs of crystalline silicon photovoltaics making use of evaporated Al as a double functional layer. The Al serves as the stress inducing element to drive ...
  • Spatially-targeted laser fabrication of multi-metal microstructures inside a hydrogel 
    Machida, Manan; Niidome, Takuro; Onoe, Hiroaki; Heisterkamp, Alexander; Terakawa, Mitsohiro (Washington, DC : OSA - The Optical Society, 2019)
    The spatially-targeted fabrication of bimetallic microstructures coexisting in the supporting hydrogel is demonstrated by multi-photon photoreduction. Microstructures composed of gold and silver were fabricated along a ...

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