Browsing Fakultät für Mathematik und Physik by Subject "X ray diffraction analysis"

Browsing Fakultät für Mathematik und Physik by Subject "X ray diffraction analysis"

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  • Langer, T.; Pfnür, Herbert; Schumacher, H.W.; Tegenkamp, Christoph (College Park, MD : American Institute of Physics, 2009)
    Electron energy loss spectroscopy (EELS) is used to study the transition from the buffer layer to the first graphene layers during graphitization of SiC(0001). Graphene growth is controlled and correlated with spot profile ...
  • Niepelt, Raphael; Hensen, Jan; Steckenreiter, Verena; Brendel, Rolf; Kajari-Schröder, Sarah (Cambridge : Cambridge University Press, 2015)
    We report on a kerfless exfoliation approach to further reduce the costs of crystalline silicon photovoltaics making use of evaporated Al as a double functional layer. The Al serves as the stress inducing element to drive ...

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