Reiter, Sina; Koper, Nico; Reineke-Koch, Rolf; Larionova, Yevgeniya; Turcu, Mircea; Krügener, Jan; Tetzlaff, Dominic; Wietler, Tobias; Höhne, Uwe; Kähler, Jan-Dirk; Brendel, Rolf; Peibst, Robby
(London : Elsevier Ltd., 2016)
We investigate the optical properties of n- and p-type polycrystalline silicon (poly-Si) layers. We determine the optical constants n and k of the complex refractive index of polycrystalline silicon by using variable-angle ...