Schlichting, S.; Willemsen, Thomas; Ehlers, H.; Morgner, Uwe; Ristau, Detlev
(Bellingham, WA : S P I E - International Society for Optical Engineering, 2015)
In the presented work a fast frequency domain measurement system to determine group delay (GD) and group delay dispersion (GDD) of optical coatings is proposed. The measurements are performed in situ directly on moving ...