Langer, T.; Pfnür, Herbert; Schumacher, H.W.; Tegenkamp, Christoph
(College Park, MD : American Institute of Physics, 2009)
Electron energy loss spectroscopy (EELS) is used to study the transition from the buffer layer to the first graphene layers during graphitization of SiC(0001). Graphene growth is controlled and correlated with spot profile ...