Auflistung Fakultät für Maschinenbau nach Autor/in "75e44f73-41a7-469a-9d54-91f4dc31d1dd"

Auflistung Fakultät für Maschinenbau nach Autor/in "75e44f73-41a7-469a-9d54-91f4dc31d1dd"

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  • Matthias, Steffen; Kästner, Markus; Reithmeier, Eduard (London : IOP, 2018-08-01)
    Optical measuring devices are widely used in industrial production and maintenance processes. With increasing integration, the accessibility of functional elements inside machines is limited for measuring devices. In order ...
  • Matthias, Steffen; Kästner, Markus; Reithmeier, Eduard (Bellingham, Wash. : SPIE, 2016)
    The inspection of functional elements is a crucial part of modern production cycles. However, with higher integration of production machinery and products, the accessibility for measurement systems is more and more limited. ...
  • Matthias, Steffen; Kästner, Markus; Reithmeier, Eduard (Bellingham, Wash. : SPIE, 2015)
    Sheet-bulk metal forming is a new production process capable of performing deep-drawing and massive forming steps in a single operation. However, due to the high forming forces of the forming process, continuous process ...
  • Matthias, Steffen; Kästner, Markus; Reithmeier, Eduard (Bellingham, Wash. : SPIE, 2016)
    Inspection of machine elements is an important task in production processes in order to ensure the quality of produced parts and to gather feedback for the continuous improvement process. A new measuring system is presented, ...
  • Matthias, Steffen; Kästner, Markus; Reithmeier, Eduard (Bellingham, Wash. : SPIE, 2017)
    To enable in-process inspection of industrial manufacturing processes, measuring devices need to fulfill time and space constraints, while also being robust to environmental conditions, such as high temperatures and ...
  • Matthias, Steffen; Ohrt, Christoph; Pösch, Andreas; Kästner, Markus; Reithmeier, Eduard (Budapest : International Measurement Confederation (IMEKO), 2015)
    Fringe projection is an important technology for the measurement of free form elements in several application fields. It can be applied to measure geometry elements smaller than one millimeter. In combination with deviation ...

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