Near Constant Loss in Glassy and Crystalline LiAlSi2O6 from Conductivity Relaxation Measurements

Abstract

Polycrystalline and glassy LiAlSi2O6 are studied by dielectric relaxation measurements for the purpose of characterizing the nearly frequency independent contribution to the dielectric loss (near constant loss), which is commonly found in glassy ionic conductors independent of the chemical and physical structures. The data show the near constant loss is present in both the polycrystalline and glassy states of LiAlSi2O6. Further, its magnitude and temperature dependence is comparable in both forms of the same substance. The implications of these findings on the mechanism that gives rise to the near constant loss are discussed.