Measurement of finite-frequency current statistics in a single-electron transistor

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dc.identifier.uri Ubbelohde, Niels Fricke, Christian Flindt, Christian Hohls, Frank Haug, Rolf J. 2016-08-29T13:44:52Z 2016-08-29T13:44:52Z 2012-01
dc.identifier.citation Ubbelohde, Niels; Fricke, Christian; Flindt, Christian; Hohls, Frank; Haug, Rolf J.: Measurement of finite-frequency current statistics in a single-electron transistor. In: Nature Communications 3 (2012), 612. DOI:
dc.description.abstract Electron transport in nanoscale structures is strongly influenced by the Coulomb interaction that gives rise to correlations in the stream of charges and leaves clear fingerprints in the fluctuations of the electrical current. A complete understanding of the underlying physical processes requires measurements of the electrical fluctuations on all time and frequency scales, but experiments have so far been restricted to fixed frequency ranges, as broadband detection of current fluctuations is an inherently difficult experimental procedure. Here we demonstrate that the electrical fluctuations in a single-electron transistor can be accurately measured on all relevant frequencies using a nearby quantum point contact for on-chip real-time detection of the current pulses in the single-electron device. We have directly measured the frequency-dependent current statistics and, hereby, fully characterized the fundamental tunnelling processes in the single-electron transistor. Our experiment paves the way for future investigations of interaction and coherence-induced correlation effects in quantum transport. eng
dc.description.sponsorship BMBF/nanoQUIT
dc.description.sponsorship DFG/QUEST
dc.description.sponsorship Villum Kann Rasmussen Foundation
dc.description.sponsorship Swiss NSF
dc.language.iso eng
dc.publisher Lausanne : Frontiers Research Foundation
dc.relation.ispartofseries Nature Communications 3 (2012)
dc.rights CC BY-NC-SA 3.0
dc.subject real-time detection eng
dc.subject shot-noise eng
dc.subject quantum eng
dc.subject conductors eng
dc.subject transport eng
dc.subject.ddc 530 | Physik ger
dc.title Measurement of finite-frequency current statistics in a single-electron transistor
dc.type article
dc.type Text
dc.relation.issn 2041-1723
dc.bibliographicCitation.volume 3
dc.bibliographicCitation.firstPage 612
dc.description.version publishedVersion
tib.accessRights frei zug�nglich

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