Measurement of the nonlinear refractive index in optical thin films

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dc.identifier.uri Steinecke, M. Jupé, M. Kiedrowski, K. Ristau, D. 2018-05-23T07:46:34Z 2018-05-23T07:46:34Z 2017
dc.identifier.citation Steinecke, M.; Jupé, M.; Kiedrowski, K.; Ristau, D.: Measurement of the nonlinear refractive index in optical thin films. In: Proceedings of SPIE 10447 (2017), 104472A. DOI:
dc.description.abstract Based on the z-scan method, an interferometric set-up for measuring the optical Kerr-effect was engineered and optimized. Utilizing a Mach-Zehnder configuration, the wave front deformation caused by the Kerr induced selffocusing is monitored. Fitting this deformation to a theoretical approach basing on a beam propagation model, the nonlinear refractive index is obtained. The procedure can be applied to measure the nonlinear refractive index of both, the substrate material as well as the deposited dielectric layer on top of the substrate. The nonlinear refractive index of a layer specially deposited for this purpose as well as for several substrate materials was measured and the results presented. © 2017 SPIE. eng
dc.language.iso eng
dc.publisher Bellingham, WA : S P I E - International Society for Optical Engineering
dc.relation.ispartof 49th Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials 2017, September 24-27, 2017, Boulder, United States
dc.relation.ispartofseries Proceedings of SPIE 10447 (2017)
dc.rights Es gilt deutsches Urheberrecht. Das Dokument darf zum eigenen Gebrauch kostenfrei genutzt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden. Dieser Beitrag ist aufgrund einer (DFG-geförderten) Allianz- bzw. Nationallizenz frei zugänglich.
dc.subject Kerr-effect eng
dc.subject nonlinear optics eng
dc.subject self-focusing eng
dc.subject thin films eng
dc.subject Deformation eng
dc.subject Laser damage eng
dc.subject Nonlinear optics eng
dc.subject Optical materials eng
dc.subject Refractive index eng
dc.subject Thin films eng
dc.subject Wavefronts eng
dc.subject Dielectric layer eng
dc.subject Nonlinear refractive index eng
dc.subject Optical thin films eng
dc.subject Propagation modeling eng
dc.subject Self-focusing eng
dc.subject Substrate material eng
dc.subject Theoretical approach eng
dc.subject Z-scan method eng
dc.subject Optical Kerr effect eng
dc.subject.ddc 620 | Ingenieurwissenschaften und Maschinenbau ger
dc.title Measurement of the nonlinear refractive index in optical thin films
dc.type article
dc.type conferenceObject
dc.type Text
dc.relation.issn 0277-786X
dc.bibliographicCitation.volume 10447
dc.bibliographicCitation.firstPage 104472A
dc.description.version publishedVersion
tib.accessRights frei zug�nglich

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