dc.identifier.uri |
http://dx.doi.org/10.15488/2827 |
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dc.identifier.uri |
http://www.repo.uni-hannover.de/handle/123456789/2853 |
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dc.contributor.author |
Keyser, U.F.
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dc.contributor.author |
Schumacher, Hans W.
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dc.contributor.author |
Zeitler, U.
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dc.contributor.author |
Haug, Rolf J.
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dc.contributor.author |
Eberl, K.
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dc.date.accessioned |
2018-02-23T10:08:37Z |
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dc.date.available |
2018-02-23T10:08:37Z |
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dc.date.issued |
2000 |
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dc.identifier.citation |
Keyser, U.F.; Schumacher, H.W.; Zeitler, U.; Haug, R.J.; Eberl, K.: Fabrication of a single-electron transistor by current-controlled local oxidation of a two-dimensional electron system. In: Applied Physics Letters 76 (2000), Nr. 4, S. 457-459. DOI: https://doi.org/10.1063/1.125786 |
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dc.description.abstract |
The surface layers of a GaAs/AlGaAs heterostructure are locally oxidized using an atomic force microscope. The local anodic oxidation depletes the underlying two-dimensional electron gas leading to the formation of tunneling barriers. The height of the barriers is determined by measuring the thermally activated current. By varying the oxidation current, the barrier heights can be tuned between a few meV and more than 100 meV. Using these barriers as tunneling elements, a side gated single-electron transistor is fabricated. © 2000 American Institute of Physics. |
eng |
dc.language.iso |
eng |
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dc.publisher |
College Park, MD : American Institute of Physics |
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dc.relation.ispartofseries |
Applied Physics Letters 76 (2000), Nr. 4 |
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dc.rights |
Es gilt deutsches Urheberrecht. Das Dokument darf zum eigenen Gebrauch kostenfrei genutzt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden. |
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dc.subject.ddc |
530 | Physik
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ger |
dc.title |
Fabrication of a single-electron transistor by current-controlled local oxidation of a two-dimensional electron system |
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dc.type |
Article |
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dc.type |
Text |
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dc.relation.issn |
00036951 |
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dc.relation.doi |
https://doi.org/10.1063/1.125786 |
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dc.bibliographicCitation.issue |
4 |
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dc.bibliographicCitation.volume |
76 |
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dc.bibliographicCitation.firstPage |
457 |
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dc.bibliographicCitation.lastPage |
459 |
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dc.description.version |
publishedVersion |
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tib.accessRights |
frei zug�nglich |
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