Lithium Permeation through Thin Lithium-Silicon Films for Battery Applications Investigated by Neutron Reflectometry

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dc.identifier.uri http://dx.doi.org/10.15488/2639
dc.identifier.uri http://www.repo.uni-hannover.de/handle/123456789/2665
dc.contributor.author Strauß, Florian
dc.contributor.author Hüger, Erwin
dc.contributor.author Heitjans, Paul
dc.contributor.author Geue, Thomas
dc.contributor.author Stahn, Jochen
dc.contributor.author Schmidt, Harald
dc.date.accessioned 2018-01-19T12:03:35Z
dc.date.available 2018-01-19T12:03:35Z
dc.date.issued 2016
dc.identifier.citation Strauß, F.; Hüger, E.; Heitjans, P.; Geue, T.; Stahn, J.; Schmidt, H.: Lithium Permeation through Thin Lithium-Silicon Films for Battery Applications Investigated by Neutron Reflectometry. In: Energy Technology 4 (2016), Nr. 12, S. 1582-1587. DOI: https://doi.org/10.1002/ente.201600209
dc.description.abstract In the ongoing search for new negative electrode materials for lithium-ion batteries, amorphous silicon with a theoretical specific capacity of almost 4000 mA h g−1 is still one of the most promising candidates. In order to optimize cycling behavior, prelithiation of silicon is discussed as possible solution. Yet, little is known about kinetics in the Li-Si system, especially with a low lithium content. Using neutron reflectometry as a tool, lithium permeation through amorphous LixSi layers was probed during annealing. From the results a lithium permeability (diffusivity×solubility) of P=(3.3±0.9)×10−21 m2 s−1 is derived for LixSi (x≈0.1), which is identical to that of pure amorphous silicon. eng
dc.language.iso eng
dc.publisher Weinheim : Wiley-VCH Verlag
dc.relation.ispartofseries Energy Technology 4 (2016), Nr. 12
dc.rights CC BY-NC 4.0 Unported
dc.rights.uri https://creativecommons.org/licenses/by-nc/4.0/
dc.subject lithium-ion batteries eng
dc.subject cycling eng
dc.subject.ddc 620 | Ingenieurwissenschaften und Maschinenbau ger
dc.title Lithium Permeation through Thin Lithium-Silicon Films for Battery Applications Investigated by Neutron Reflectometry
dc.type article
dc.type Text
dc.relation.issn 21944288
dc.relation.doi https://doi.org/10.1002/ente.201600209
dc.bibliographicCitation.issue 12
dc.bibliographicCitation.volume 4
dc.bibliographicCitation.firstPage 1582
dc.bibliographicCitation.lastPage 1587
dc.description.version publishedVersion
tib.accessRights frei zug�nglich


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