Uncertainty of the coefficient of band-to-band absorption of crystalline silicon at near-infrared wavelengths

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dc.identifier.uri http://dx.doi.org/10.15488/2543
dc.identifier.uri http://www.repo.uni-hannover.de/handle/123456789/2569
dc.contributor.author Schinke, Carsten
dc.contributor.author Bothe, Karsten
dc.contributor.author Peest, Peter Christian
dc.contributor.author Schmidt, Jan
dc.contributor.author Brendel, Rolf
dc.date.accessioned 2017-12-12T12:31:42Z
dc.date.available 2017-12-12T12:31:42Z
dc.date.issued 2014
dc.identifier.citation Schinke, C.; Bothe, K.; Peest, P.C.; Schmidt, J.; Brendel, R.: Uncertainty of the coefficient of band-to-band absorption of crystalline silicon at near-infrared wavelengths. In: Applied Physics Letters 104 (2014), Nr. 8, 81915. DOI: https://doi.org/10.1063/1.4866916
dc.description.abstract We present data of the coefficient of band-to-band absorption of crystalline silicon at 295 K in the wavelength range from 950 to 1350 nm and analyze its uncertainty. The data is obtained from measurements of reflectance and transmittance as well as spectrally resolved photoluminescence measurements and spectral response measurements. A rigorous measurement uncertainty analysis based on an extensive characterization of our setups is carried out. We determine relative uncertainties of 4% at 1000 nm, increasing to 22% at 1200 nm and 160% at 1300 nm, and show that all methods yield comparable results. © 2014 AIP Publishing LLC. eng
dc.language.iso eng
dc.publisher College Park, MD : American Institute of Physics
dc.relation.ispartofseries Applied Physics Letters 104 (2014), Nr. 8
dc.rights Es gilt deutsches Urheberrecht. Das Dokument darf zum eigenen Gebrauch kostenfrei genutzt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden.
dc.subject Physical properties eng
dc.subject Physics eng
dc.subject Crystalline silicons eng
dc.subject Measurement uncertainty analysis eng
dc.subject Near-infrared wavelength eng
dc.subject Photoluminescence measurements eng
dc.subject Relative uncertainty eng
dc.subject Spectral response measurements eng
dc.subject Wavelength ranges eng
dc.subject Uncertainty analysis eng
dc.subject.ddc 530 | Physik ger
dc.title Uncertainty of the coefficient of band-to-band absorption of crystalline silicon at near-infrared wavelengths eng
dc.type Article
dc.type Text
dc.relation.issn 00036951
dc.relation.doi https://doi.org/10.1063/1.4866916
dc.bibliographicCitation.issue 8
dc.bibliographicCitation.volume 104
dc.bibliographicCitation.firstPage 81915
dc.description.version publishedVersion
tib.accessRights frei zug�nglich


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