Impact of contacting geometries on measured fill factors

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dc.identifier.uri http://dx.doi.org/10.15488/2273
dc.identifier.uri http://www.repo.uni-hannover.de/handle/123456789/2299
dc.contributor.author Kruse, Christian N.
dc.contributor.author Wolf, Martin
dc.contributor.author Schinke, Carsten
dc.contributor.author Hinken, David
dc.contributor.author Brendel, Rolf
dc.contributor.author Bothe, Karsten
dc.date.accessioned 2017-11-13T08:18:12Z
dc.date.available 2017-11-13T08:18:12Z
dc.date.issued 2017
dc.identifier.citation Kruse, C.N.; Wolf, M.; Schinke, C.; Hinken, D.; Brendel, R. et al.: Impact of contacting geometries on measured fill factors. In: Energy Procedia 124 (2017), S. 84-90. DOI: https://doi.org/10.1016/j.egypro.2017.09.329
dc.description.abstract The fill factor determined from a measured current-voltage characteristic of a bare solar cell depends on the number and positions of the electrical contacting probes. Nine different geometries for contacting the front side busbars are used to measure the current-voltage (I-V) characteristics of a 5 busbar industrial-type passivated emitter and rear totally diffused (PERT) solar cell under standard testing conditions. The fill factors of the measured I-V characteristics vary from 78.5 %abs to 80.6 %abs. We further measure the contacting resistance of 3 different contacting probes to estimate the sensitivity of measurements with different contacting geometries on random resistance variations. The contacting resistance is 60 mΩ for nine-point probes and 80 mΩ for four- and single-point probes. We determine the magnitude of contacting resistance variations from measurements at different probe positions to be ±30 mΩ. Using this variation, we perform numerical simulations and find a larger sensitivity on random resistance variations for tandem- (pairs of current- and sense probes) compared to triplet (one sense- between two current probes) configurations. The corresponding fill factor deviation is approximately 0.1%abs for tandem configurations when the contacting resistances of up to two current probes are altered. The sensitivity for triplet configurations is negligible. eng
dc.language.iso eng
dc.publisher London : Elsevier Ltd.
dc.relation.ispartof 7th International Conference on Silicon Photovoltaics, SiliconPV 2017, April 03-05, 2017, Freiburg, Germany
dc.relation.ispartofseries Energy Procedia 124 (2017)
dc.rights CC BY-NC-ND 4.0 Unported
dc.rights.uri https://creativecommons.org/licenses/by-nc-nd/4.0/
dc.subject Characterization of PV eng
dc.subject Current-voltage characteristics eng
dc.subject Fill Factor eng
dc.subject Busbars eng
dc.subject Geometry eng
dc.subject Probes eng
dc.subject Sensitivity analysis eng
dc.subject Solar cells eng
dc.subject Different geometry eng
dc.subject Fill factor eng
dc.subject IV characteristics eng
dc.subject Measured currents eng
dc.subject Probe position eng
dc.subject Resistance variations eng
dc.subject Standard testing eng
dc.subject Tandem configuration eng
dc.subject Current voltage characteristics eng
dc.subject.ddc 333,7 | Natürliche Ressourcen, Energie und Umwelt ger
dc.title Impact of contacting geometries on measured fill factors
dc.type article
dc.type Text
dc.relation.issn 1876-6102
dc.relation.doi https://doi.org/10.1016/j.egypro.2017.09.329
dc.bibliographicCitation.volume 124
dc.bibliographicCitation.firstPage 84
dc.bibliographicCitation.lastPage 90
dc.description.version publishedVersion
tib.accessRights frei zug�nglich


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