dc.identifier.uri |
http://dx.doi.org/10.15488/1879 |
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dc.identifier.uri |
http://www.repo.uni-hannover.de/handle/123456789/1904 |
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dc.contributor.author |
Edler, Frederik
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dc.contributor.author |
Miccoli, Ilio
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dc.contributor.author |
Demuth, Stephanie
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dc.contributor.author |
Pfnür, Herbert
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dc.contributor.author |
Wippermann, S.
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dc.contributor.author |
Lücke, A.
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dc.contributor.author |
Schmidt, W.G.
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dc.contributor.author |
Tegenkamp, Christoph
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dc.date.accessioned |
2017-09-14T07:14:16Z |
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dc.date.available |
2017-09-14T07:14:16Z |
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dc.date.issued |
2015 |
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dc.identifier.citation |
Edler, F.; Miccoli, I.; Demuth, S.; Pfnür, H.; Wippermann, S. et al.: Interwire coupling for In(4x1) /Si(111) probed by surface transport. In: Physical Review B - Condensed Matter and Materials Physics 92 (2015), Nr. 8, No. 85426. DOI: https://doi.org/10.1103/PhysRevB.92.085426 |
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dc.description.abstract |
The In/Si(111) system reveals an anisotropy in the electrical conductivity and is a prototype system for atomic wires on surfaces. We use this system to study and tune the interwire interaction by adsorption of oxygen. Through rotational square four-tip transport measurements, both the parallel (σ||) and perpendicular (σ⊥) components are measured separately. The analysis of the I(V) curves reveals that σ⊥ is also affected by adsorption of oxygen, showing clearly an effective interwire coupling, in agreement with density-functional-theory-based calculations of the transmittance. In addition to these surface-state mediated transport channels, we confirm the existence of conducting parasitic space-charge layer channels and address the importance of substrate steps by performing the transport measurements of In phases grown on Si(111) mesa structures. |
eng |
dc.description.sponsorship |
DFG/FOR/1700 |
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dc.language.iso |
eng |
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dc.publisher |
College Park, MD : American Physical Society |
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dc.relation.ispartofseries |
Physical Review B 92 (2015), Nr. 8 |
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dc.rights |
Es gilt deutsches Urheberrecht. Das Dokument darf zum eigenen Gebrauch kostenfrei genutzt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden. |
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dc.subject.ddc |
530 | Physik
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ger |
dc.title |
Interwire coupling for In(4x1) /Si(111) probed by surface transport |
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dc.type |
Article |
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dc.type |
Text |
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dc.relation.issn |
10980121 |
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dc.relation.doi |
https://doi.org/10.1103/PhysRevB.92.085426 |
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dc.bibliographicCitation.issue |
8 |
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dc.bibliographicCitation.volume |
92 |
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dc.bibliographicCitation.firstPage |
85426 |
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dc.description.version |
publishedVersion |
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tib.accessRights |
frei zug�nglich |
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