Interwire coupling for In(4x1) /Si(111) probed by surface transport

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dc.identifier.uri http://dx.doi.org/10.15488/1879
dc.identifier.uri http://www.repo.uni-hannover.de/handle/123456789/1904
dc.contributor.author Edler, Frederik
dc.contributor.author Miccoli, Ilio
dc.contributor.author Demuth, Stephanie
dc.contributor.author Pfnür, Herbert
dc.contributor.author Wippermann, S.
dc.contributor.author Lücke, A.
dc.contributor.author Schmidt, W.G.
dc.contributor.author Tegenkamp, Christoph
dc.date.accessioned 2017-09-14T07:14:16Z
dc.date.available 2017-09-14T07:14:16Z
dc.date.issued 2015
dc.identifier.citation Edler, F.; Miccoli, I.; Demuth, S.; Pfnür, H.; Wippermann, S. et al.: Interwire coupling for In(4x1) /Si(111) probed by surface transport. In: Physical Review B - Condensed Matter and Materials Physics 92 (2015), Nr. 8, No. 85426. DOI: https://doi.org/10.1103/PhysRevB.92.085426
dc.description.abstract The In/Si(111) system reveals an anisotropy in the electrical conductivity and is a prototype system for atomic wires on surfaces. We use this system to study and tune the interwire interaction by adsorption of oxygen. Through rotational square four-tip transport measurements, both the parallel (σ||) and perpendicular (σ⊥) components are measured separately. The analysis of the I(V) curves reveals that σ⊥ is also affected by adsorption of oxygen, showing clearly an effective interwire coupling, in agreement with density-functional-theory-based calculations of the transmittance. In addition to these surface-state mediated transport channels, we confirm the existence of conducting parasitic space-charge layer channels and address the importance of substrate steps by performing the transport measurements of In phases grown on Si(111) mesa structures. eng
dc.description.sponsorship DFG/FOR/1700
dc.language.iso eng
dc.publisher College Park, MD : American Physical Society
dc.relation.ispartofseries Physical Review B 92 (2015), Nr. 8
dc.rights Es gilt deutsches Urheberrecht. Das Dokument darf zum eigenen Gebrauch kostenfrei genutzt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden.
dc.subject.ddc 530 | Physik ger
dc.title Interwire coupling for In(4x1) /Si(111) probed by surface transport
dc.type Article
dc.type Text
dc.relation.issn 10980121
dc.relation.doi https://doi.org/10.1103/PhysRevB.92.085426
dc.bibliographicCitation.issue 8
dc.bibliographicCitation.volume 92
dc.bibliographicCitation.firstPage 85426
dc.description.version publishedVersion
tib.accessRights frei zug�nglich


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