dc.identifier.uri |
http://dx.doi.org/10.15488/11595 |
|
dc.identifier.uri |
https://www.repo.uni-hannover.de/handle/123456789/11686 |
|
dc.contributor.author |
Cheng, Lining
|
eng |
dc.contributor.author |
Zhang, Chao
|
eng |
dc.contributor.author |
Li, Xiaoyan
|
eng |
dc.contributor.author |
Almeev, Renat R.
|
eng |
dc.contributor.author |
Yang, Xiaosong
|
eng |
dc.contributor.author |
Holtz, Francois
|
eng |
dc.date.accessioned |
2021-12-20T15:19:44Z |
|
dc.date.available |
2021-12-20T15:19:44Z |
|
dc.date.issued |
2019 |
|
dc.identifier.citation |
Cheng, L.; Zhang, C.; Li, X.; Almeev, R.R.; Yang, X.; Holtz, F.: Improvement of Electron Probe Microanalysis of Boron Concentration in Silicate Glasses. In: Microscopy and Microanalysis 25 (2019), Nr. 4, S. 874-882. DOI: https://doi.org/10.1017/S1431927619014612 |
eng |
dc.description.abstract |
The determination of low boron concentrations in silicate glasses by electron probe microanalysis (EPMA) remains a significant challenge. The internal interferences from the diffraction crystal, i.e. the Mo-B4C large d-spacing layered synthetic microstructure crystal, can be thoroughly diminished by using an optimized differential mode of pulse height analysis (PHA). Although potential high-order spectral interferences from Ca, Fe, and Mn on the BKα peak can be significantly reduced by using an optimized differential mode of PHA, a quantitative calibration of the interferences is required to obtain accurate boron concentrations in silicate glasses that contain these elements. Furthermore, the first-order spectral interference from ClL-lines is so strong that they hinder reliable EPMA of boron concentrations in Cl-bearing silicate glasses. Our tests also indicate that, due to the strongly curved background shape on the high-energy side of BKα, an exponential regression is better than linear regression for estimating the on-peak background intensity based on measured off-peak background intensities. We propose that an optimal analytical setting for low boron concentrations in silicate glasses (≥0.2 wt% B2O3) would best involve a proper boron-rich glass standard, a low accelerating voltage, a high beam current, a large beam size, and a differential mode of PHA. |
eng |
dc.language.iso |
eng |
eng |
dc.publisher |
Cambridge : Cambridge University Press |
|
dc.relation.ispartofseries |
Microscopy and Microanalysis 25 (2019), Nr. 4 |
eng |
dc.rights |
Es gilt deutsches Urheberrecht. Das Dokument darf zum eigenen Gebrauch kostenfrei genutzt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden. Dieser Beitrag ist aufgrund einer (DFG-geförderten) Allianz- bzw. Nationallizenz frei zugänglich. |
eng |
dc.subject |
boron |
eng |
dc.subject |
electron probe microanalysis |
eng |
dc.subject |
high-energy background |
eng |
dc.subject |
silicate glass |
eng |
dc.subject |
tourmaline |
eng |
dc.subject.ddc |
570 | Biowissenschaften, Biologie
|
eng |
dc.title |
Improvement of Electron Probe Microanalysis of Boron Concentration in Silicate Glasses |
eng |
dc.type |
Article |
eng |
dc.type |
Text |
eng |
dc.relation.essn |
1435-8115 |
|
dc.relation.issn |
1431-9276 |
|
dc.relation.doi |
10.1017/S1431927619014612 |
|
dc.bibliographicCitation.firstPage |
874 |
|
dc.bibliographicCitation.lastPage |
882 |
|
dc.description.version |
publishedVersion |
eng |
tib.accessRights |
frei zug�nglich |
eng |