dc.identifier.uri |
http://dx.doi.org/10.15488/10579 |
|
dc.identifier.uri |
https://www.repo.uni-hannover.de/handle/123456789/10656 |
|
dc.contributor.author |
Steinecke, Morten
|
|
dc.contributor.author |
Naran, Tank Ankit
|
|
dc.contributor.author |
Keppler, Nils Christian
|
|
dc.contributor.author |
Behrens, Peter
|
|
dc.contributor.author |
Jensen, Lars
|
|
dc.contributor.author |
Jupé, Marco
|
|
dc.contributor.author |
Ristau, Detlev
|
|
dc.date.accessioned |
2021-03-23T09:46:11Z |
|
dc.date.available |
2021-03-23T09:46:11Z |
|
dc.date.issued |
2021 |
|
dc.identifier.citation |
Steinecke, M.; Naran, T.A.; Keppler, N.C.; Behrens, P.; Jensen, L. et al.: Electrical and optical properties linked to laser damage behavior in conductive thin film materials. In: Optical Materials Express 11 (2021), Nr. 1, S. 35-47. DOI: https://doi.org/10.1364/OME.410081 |
|
dc.description.abstract |
Epsilon-near-zero-materials (ENZ-materials) and their unique properties are key to the successful integration and miniaturization of optical components. Novel concepts, which promise significant progress in this field of research, such as optical switches and thin film electrooptical modulators, are possible when the electrical and optical properties of ENZ-materials are carefully exploited. To achieve a greater understanding of these properties, in this paper the electrical conductivity, optical transmittance, as well as absorption of thin indium tin oxide films, are investigated and linked to their laser-induced damage threshold in the ultra-short pulse regime. To the best of the authors’ knowledge, this is the first concise study linking the electrical properties of indium tin oxide to its properties regarding high-power laser applications. © 2020. All Rights Reserved. |
eng |
dc.language.iso |
eng |
|
dc.publisher |
Washington, DC : OSA - The Optical Society |
|
dc.relation.ispartofseries |
Optical Materials Express 11 (2021), Nr. 1 |
|
dc.rights |
CC BY 4.0 Unported |
|
dc.rights.uri |
https://creativecommons.org/licenses/by/4.0/ |
|
dc.subject |
Electrooptical materials |
eng |
dc.subject |
High power lasers |
eng |
dc.subject |
Indium compounds |
eng |
dc.subject |
Laser applications |
eng |
dc.subject |
Laser damage |
eng |
dc.subject |
Optical properties |
eng |
dc.subject |
Optical switches |
eng |
dc.subject |
Oxide films |
eng |
dc.subject |
Thin films |
eng |
dc.subject |
Tin oxides |
eng |
dc.subject |
Ultrafast lasers |
eng |
dc.subject |
Ultrashort pulses |
eng |
dc.subject |
Conductive thin films |
eng |
dc.subject |
Electrical and optical properties |
eng |
dc.subject |
Electrical conductivity |
eng |
dc.subject |
Electrooptical modulators |
eng |
dc.subject |
Epsilon-near zeros |
eng |
dc.subject |
Indium Tin Oxide films |
eng |
dc.subject |
Laser induced damage thresholds |
eng |
dc.subject |
Optical components |
eng |
dc.subject |
Optical films |
eng |
dc.subject.ddc |
620 | Ingenieurwissenschaften und Maschinenbau
|
ger |
dc.title |
Electrical and optical properties linked to laser damage behavior in conductive thin film materials |
|
dc.type |
Article |
|
dc.type |
Text |
|
dc.relation.essn |
2159-3930 |
|
dc.relation.doi |
https://doi.org/10.1364/OME.410081 |
|
dc.bibliographicCitation.issue |
1 |
|
dc.bibliographicCitation.volume |
11 |
|
dc.bibliographicCitation.firstPage |
35 |
|
dc.bibliographicCitation.lastPage |
47 |
|
dc.description.version |
publishedVersion |
|
tib.accessRights |
frei zug�nglich |
|