Measurement setup for the determination of the nonlinear refractive index of thin films with high nonlinearity

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dc.identifier.uri http://dx.doi.org/10.15488/10266
dc.identifier.uri https://www.repo.uni-hannover.de/handle/123456789/10339
dc.contributor.author Steinecke, Morten
dc.contributor.author Kellermann, Tarik
dc.contributor.author Jupé, Marco
dc.contributor.author Ristau, Detlev
dc.contributor.author Jensen, Lars
dc.contributor.editor Wren Carr, Christopher
dc.contributor.editor Exarhos, Gregory J.
dc.contributor.editor Gruzdev, Vitaly E.
dc.contributor.editor Ristau, Detlev
dc.contributor.editor Soileau, M.J.
dc.date.accessioned 2020-12-08T15:27:05Z
dc.date.available 2020-12-08T15:27:05Z
dc.date.issued 2018
dc.identifier.citation Steinecke, M.; Kellermann, T.; Jupé, M.; Ristau, D.; Jensen, L.: Measurement setup for the determination of the nonlinear refractive index of thin films with high nonlinearity. In: Proceedings of SPIE 10805 (2018), 1080524. DOI: https://doi.org/10.1117/12.2500341
dc.description.abstract The exploitation of nonlinear effects in multi-layer thin films allows for optics with novel functions, such as all-optical switching and frequency conversion. In this contribution, an improved interferometric setup for the measurement of the nonlinear refractive index in dielectric substrates and deposited single layers is presented. The setup is based on the wave front deformation caused by the self-focusing in the measured samples. Additionally, measurement results for a highly nonlinear material, indium-Tin-oxide (ITO) are presented with respect to the materials power handling capabilities and compared to values from other materials. © COPYRIGHT SPIE eng
dc.language.iso eng
dc.publisher Bellingham : SPIE
dc.relation.ispartofseries Proceedings of SPIE 10805 (2018)
dc.rights Es gilt deutsches Urheberrecht. Das Dokument darf zum eigenen Gebrauch kostenfrei genutzt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden. Dieser Beitrag ist aufgrund einer (DFG-geförderten) Allianz- bzw. Nationallizenz frei zugänglich.
dc.subject Kerr-effect eng
dc.subject Material science eng
dc.subject Nonlinear optics eng
dc.subject Self-focusing eng
dc.subject Thin films eng
dc.subject.classification Konferenzschrift ger
dc.subject.ddc 620 | Ingenieurwissenschaften und Maschinenbau ger
dc.title Measurement setup for the determination of the nonlinear refractive index of thin films with high nonlinearity eng
dc.type BookPart
dc.type Text
dc.relation.essn 1996-756X
dc.relation.isbn 978-1-5106-2194-7
dc.relation.issn 0277-786X
dc.relation.doi https://doi.org/10.1117/12.2500341
dc.bibliographicCitation.volume 10805
dc.bibliographicCitation.firstPage 1080524
dc.description.version publishedVersion
tib.accessRights frei zug�nglich


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