Application of a new ray tracing framework to the analysis of extended regions in Si solar cell modules

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dc.identifier.uri http://dx.doi.org/10.15488/999
dc.identifier.uri http://www.repo.uni-hannover.de/handle/123456789/1023
dc.contributor.author Holst, Hendrik
dc.contributor.author Winter, Matthias
dc.contributor.author Vogt, Malte R.
dc.contributor.author Bothe, Karsten
dc.contributor.author Köntges, Marc
dc.contributor.author Brendel, Rolf
dc.contributor.author Altermatt, Pietro P.
dc.date.accessioned 2016-12-22T11:22:41Z
dc.date.available 2016-12-22T11:22:41Z
dc.date.issued 2013
dc.identifier.citation Holst, H.; Winter, M.; Vogt, M.R.; Bothe, K.; Köntges, M. et al.: Application of a new ray tracing framework to the analysis of extended regions in Si solar cell modules. In: Energy Procedia 38 (2013), S. 86-93. DOI: https://doi.org/10.1016/j.egypro.2013.07.253
dc.description.abstract While ray tracing of solar cells was established decades ago, ray tracing of entire modules has met obstacles, mainly because module optics are affected by geometric structures varying over a large scale of dimensions. In this paper, we introduce a ray tracing framework that is based on a modular structure made up of separate plugins. While existing plugins can be used for common effects such as light sources, absorption in materials, etc., specialized plug-ins can be written by users to handle problem-specific properties. We demonstrate the functionality of our approach by ray tracing a test module containing 9 crystalline Si solar cells. Good agreement between light-beam induced current (LBIC) measurements and ray tracing is achieved. eng
dc.language.iso eng
dc.publisher Amsterdam : Elsevier
dc.relation.ispartofseries Energy Procedia 38 (2013)
dc.rights CC BY-NC-ND 3.0 Unported
dc.rights.uri https://creativecommons.org/licenses/by-nc-nd/3.0/
dc.subject LBIC eng
dc.subject Module eng
dc.subject Ray tracing eng
dc.subject.classification Konferenzschrift ger
dc.subject.ddc 600 | Technik ger
dc.subject.ddc 620 | Ingenieurwissenschaften und Maschinenbau ger
dc.subject.ddc 530 | Physik ger
dc.title Application of a new ray tracing framework to the analysis of extended regions in Si solar cell modules eng
dc.type Article
dc.type Text
dc.relation.issn 18766102
dc.relation.doi https://doi.org/10.1016/j.egypro.2013.07.253
dc.bibliographicCitation.volume 38
dc.bibliographicCitation.firstPage 86
dc.bibliographicCitation.lastPage 93
dc.description.version publishedVersion
tib.accessRights frei zug�nglich


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