Shutterless ion mobility spectrometer with fast pulsed electron source

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Bunert, E.; Heptner, A.; Reinecke, T.; Kirk, A.T:; Zimmermann, S.: Shutterless ion mobility spectrometer with fast pulsed electron source. In: Review of Scientific Instruments 88 (2017), 024102. DOI:

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Sum total of downloads: 105

Ion mobility spectrometers (IMS) are devices for fast and very sensitive trace gas analysis. The measuring principle is based on an initial ionization process of the target analyte. Most IMS employ radioactive electron sources, such as 63Ni or 3H. These radioactive materials have the disadvantage of legal restrictions and the electron emission has a predetermined intensity and cannot be controlled or disabled. In this work, we replaced the 3H source of our IMS with 100 mm drift tube length with our nonradioactive electron source, which generates comparable spectra to the 3H source. An advantage of our emission current controlled nonradioactive electron source is that it can operate in a fast pulsed mode with high electron intensities. By optimizing the geometric parameters and developing fast control electronics, we can achieve very short electron emission pulses for ionization with high intensities and an adjustable pulse width of down to a few nanoseconds. This results in small ion packets at simultaneously high ion densities, which are subsequently separated in the drift tube. Normally, the required small ion packet is generated by a complex ion shutter mechanism. By omitting the additional reaction chamber, the ion packet can be generated directly at the beginning of the drift tube by our pulsed nonradioactive electron source with only slight reduction in resolving power. Thus, the complex and costly shutter mechanism and its electronics can also be omitted, which leads to a simple low-cost IMS-system with a pulsed nonradioactive electron source and a resolving power of 90.
License of this version: Es gilt deutsches Urheberrecht. Das Dokument darf zum eigenen Gebrauch kostenfrei genutzt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden.
Document Type: article
Publishing status: publishedVersion
Issue Date: 2017
Appears in Collections:Fakultät für Elektrotechnik und Informatik

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1 image of flag of Germany Germany 72 68.57%
2 image of flag of China China 12 11.43%
3 image of flag of United States United States 9 8.57%
4 image of flag of Japan Japan 3 2.86%
5 image of flag of Spain Spain 3 2.86%
6 image of flag of Korea, Republic of Korea, Republic of 2 1.90%
7 image of flag of No geo information available No geo information available 1 0.95%
8 image of flag of Thailand Thailand 1 0.95%
9 image of flag of Russian Federation Russian Federation 1 0.95%
10 image of flag of Finland Finland 1 0.95%

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