Numerical computation of magnetic fields applied to magnetic force microscopy

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Preisner, T.; Greiff, M.; Bala, U.B.; Mathis, W.: Numerical computation of magnetic fields applied to magnetic force microscopy. In: COMPEL - The International Journal for Computation and Mathematics in Electrical and Electronic Engineering 28 (2009), Nr. 1, S. 120-129. DOI: https://doi.org/10.1108/03321640910918922

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To cite the version in the repository, please use this identifier: https://doi.org/10.15488/2741

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Sum total of downloads: 235




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Abstract: 
Purpose - The purpose of this paper is to introduce a method which allows the calculation of the interactions of tip and sample of a magnetic force microscope as a first step to increase the accuracy of this technique. Design/methodology/approach - The emerging magnetic interactions between the cantilever tip and an arbitrary magnetized sample can be evaluated by the use of several numerical methods. For modelling this magnetically and mechanically coupled multiscale problem the finite element method is implemented. Findings - The evaluated magnetic fields interact in such a manner that a constructive overlap at the tip apex occurs. This leads to attractive forces acting on the cantilever. Research limitations/implications - In order to include the magneto-mechanical coupling, the implementation of a detailed force calculation is necessary. Furthermore, a hysteresis model is not yet considered. Practical implications - Magnetic force microscopy is a very sensitive technique. For instance, ideally the end of the tip consists of only one atom, but this is not realizable. Measurement errors cannot be avoided. This approach is the first step in developing an opportunity to soften them. Originality/value - One opportunity to verify real-time magnetic force microscope measurements is the comparison with theoretical considerations and calculations of the occurring magnetic distribution by using this technique. For this reason this paper deals with a new micromagnetic model to simulate the interactions between tip and sample of a scanning process of a magnetic force microscope. © Emerald Group Publishing Limited.
License of this version: Es gilt deutsches Urheberrecht. Das Dokument darf zum eigenen Gebrauch kostenfrei genutzt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden. Dieser Beitrag ist aufgrund einer (DFG-geförderten) Allianz- bzw. Nationallizenz frei zugänglich.
Document Type: Article
Publishing status: publishedVersion
Issue Date: 2009
Appears in Collections:Fakultät für Elektrotechnik und Informatik

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pos. country downloads
total perc.
1 image of flag of Germany Germany 126 53.62%
2 image of flag of United States United States 39 16.60%
3 image of flag of China China 14 5.96%
4 image of flag of Canada Canada 6 2.55%
5 image of flag of Taiwan Taiwan 5 2.13%
6 image of flag of Austria Austria 5 2.13%
7 image of flag of India India 4 1.70%
8 image of flag of Iran, Islamic Republic of Iran, Islamic Republic of 3 1.28%
9 image of flag of France France 3 1.28%
10 image of flag of Spain Spain 3 1.28%
    other countries 27 11.49%

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