For studies of the interface zone of metallic composites with significantly differing mechanical properties across the interface, high-quality sample preparation is paramount. In particular, the analysis of the composition or geometric characteristics of intermetallic phases close to the interface requires a preparation specifically adapted to the actual sample. In the present study, the combination of ion beam processing and a conventional metallographic preparation routine is investigated. It is shown that by utilizing a suitable combination of metallographic and ion beam processing routines, the interface zone of metallic composites can be prepared specifically targeted to a given analytical task. Especially for material combinations with largely differing mechanical properties of the base materials, ion beam processing can greatly improve the sample preparation quality. © 2020, The Author(s).