Browsing by Subject "signal dedicated verification (SiDeV)"

Browsing by Subject "signal dedicated verification (SiDeV)"

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  • Extension of the IEC 61000-4-20 Annex C to the Use of Arbitrary Transient Signals 
    Briest, Niklas; Hamann, David; Garbe, Heyno; Potthast, Stefan (Piscataway, NJ : Institute of Electrical and Electronics Engineers Inc., 2017)
    Transverse electromagnetic (TEM) waveguides are predominantly used for emission and immunity tests. General requirements for TEM waveguides are given by the IEC 61000-4-20. Annex C of the IEC 61000-4-20 specifies immunity ...