Steinecke, M.; Jupé, M.; Kiedrowski, K.; Ristau, D.
(Bellingham, WA : S P I E - International Society for Optical Engineering, 2017)
Based on the z-scan method, an interferometric set-up for measuring the optical Kerr-effect was engineered and optimized. Utilizing a Mach-Zehnder configuration, the wave front deformation caused by the Kerr induced ...