Rizos, Apostolos K.; Alifragis, J.; Ngai, K.L.; Heitjans, Paul
(College Park, MA : American Institute of Physics (AIP), 2001)
Polycrystalline and glassy LiAlSi2O6 are studied by dielectric relaxation measurements for the purpose of characterizing the nearly frequency independent contribution to the dielectric loss (near constant loss), which is ...