Browsing by Subject "X-rays"

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  • Bunert, Erik; Heptner, Andre; Reinecke, T.; Kirk, Ansgar T.; Zimmermann, Stefan (College Park, MA : American Institute of Physics (AIP), 2017)
    Ion mobility spectrometers (IMS) are devices for fast and very sensitive trace gas analysis. The measuring principle is based on an initial ionization process of the target analyte. Most IMS employ radioactive electron ...