Home
→
Browsing by Subject

Browsing by Subject "Scattering parameters"

Now showing items 1-8 of 8

Behavioral modeling of nonlinear transfer systems with load-dependent X-parameters

Moosavi, Seyed Mohammadamin; Widemann, Christian; Mathis, Wolfgang (Göttingen : Copernicus GmbH, 2017)

In this contribution, different approaches based on the X-parametersTM to model the behavior of mismatched nonlinear transfer systems are examined. The X-parameters based on the PHD1-principle introduced by Verspecht and ...
Calibration-measurement unit for the automation of vector network analyzer measurements

Rolfes, I.; Will, B.; Schiek, B. (Göttingen : Copernicus GmbH, 2008)

With the availability of multi-port vector network analyzers, the need for automated, calibrated measurement facilities increases. In this contribution, a calibrationmeasurement unit is presented which realizes a repeatable ...
Contactless electromagnetic measuring system using conventional calibration algorithms to determine scattering parameters

Zelder, T.; Rabe, H.; Eul, H. (Göttingen : Copernicus GmbH, 2007)

In this paper, a contactless measuring system for the determination of the S-parameters of planar circuits is presented. With a contactless measuring system it is possible to characterise a device-under-test (DUT) embedded ...
Measured Response of Local, Mid-range and Far-range Discontinuities of Large Metal Groundplanes using Time Domain Techniques

Schrader, T.; Münter, K.; Battermann, S.; Garbe, Heyno (Göttingen : Copernicus GmbH, 2005)

This work describes a method to detect and to quantify any local or mid-range discontinuity on extended flat metal planes. Often these planes are used for antenna calibration (open area test site-OATS) or the plane could ...
Methods for the calibrated measurement of the scattering parameters of planar multi-port devices

Rolfes, I.; Schiek, B. (Göttingen : Copernicus GmbH, 2007)

In this article, the error-corrected determination of complex scattering parameters of multi-port devices by means of a 2-port vector network analyzer is presented. As only two ports of the device under test can be connected ...
Novel algorithms for the characterization of n-port networks by using a two-port network analyzer

Will, B.; Rolfes, I.; Schiek, B. (Göttingen : Copernicus GmbH, 2007)

The measurement of the scattering matrices of n-port networks is an important task. For this purpose two ports of the n-port network are connected with the network analyzer and the remaining ports are connected to reflecting ...
Obstacle-based self-calibration techniques for the determination of the permittivity of liquids

Rolfes, I. (Göttingen : Copernicus GmbH, 2007)

In this contribution, different obstacle-based self-calibration techniques for the measurement of the dielectric properties of liquids are investigated at microwave frequencies. The liquid under test is contained inside a ...
Usage of the contactless vector network analysis with varying transmission line geometries

Zelder, T.; Geck, B.; Rolfes, I.; Eul, H. (Göttingen : Copernicus GmbH, 2008)

The scattering parameters of embedded devices can be measured by means of contactless vector network analysis. To achieve accurate measurement results, the contactless measurement setup has to be calibrated. However, if ...

Now showing items 1-8 of 8

Submit new document to repository

Browse

All content
- Communities & Collections
- By Issue Date
- Authors
- Titles
- Subjects
- Subjects (GND)
- DDC
- License
- Type

My Account

Usage Statistics

of the Repository

Browsing by Subject "Scattering parameters"

Browsing by Subject "Scattering parameters"

Browse

All content

My Account

Usage Statistics