Browsing by Subject "Quantum metrology"

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  • Kalmbach, C.-C.; Ahlers, Franz-J.; Schurr, J.; Müller, A.; Feilhauer, J.; Kruskopf, M.; Pierz, Klaus; Hohls, Frank; Haug, Rolf J. (College Park, MD : American Physical Society, 2016)
    We investigate the 1/f noise properties of epitaxial graphene devices at low temperatures as a function of temperature, current, and magnetic flux density. At low currents, an exponential decay of the 1/f noise power ...