Browsing by Subject "Optical thin films"

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  • Schlichting, S.; Willemsen, Thomas; Ehlers, H.; Morgner, Uwe; Ristau, Detlev (Bellingham, WA : S P I E - International Society for Optical Engineering, 2015)
    In the presented work a fast frequency domain measurement system to determine group delay (GD) and group delay dispersion (GDD) of optical coatings is proposed. The measurements are performed in situ directly on moving ...
  • Steinecke, M.; Jupé, M.; Kiedrowski, K.; Ristau, D. (Bellingham, WA : S P I E - International Society for Optical Engineering, 2017)
    Based on the z-scan method, an interferometric set-up for measuring the optical Kerr-effect was engineered and optimized. Utilizing a Mach-Zehnder configuration, the wave front deformation caused by the Kerr induced ...