Browsing by Subject "Lifetime measurements"

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Extraction of PEDOT:PSS/c-Si Junction Properties by Modeling of Injection-Dependent Lifetime Measurements Including Depletion Region Modulation

Halbich, Marc-Uwe; Schmidt, Jan (Weinheim : Wiley-VCH, 2021)

The carrier lifetime of n-type silicon wafers coated with the conducting polymer PEDOT:PSS as a function of the excess carrier concentration Δp within the wafer is characterized using the quasi-steady-state photoconductance ...
Selectivity of TiOx-Based Electron-Selective Contacts on n-Type Crystalline Silicon and Solar Cell Efficiency Potential

Titova, Valeriya; Schmidt, Jan (Weinheim : Wiley-VCH, 2021)

The selectivity parameter S10 of titanium oxide (TiOx)-based selective contacts on n-type silicon is experimentally extracted through measurements of the specific contact resistivity ρc and the recombination current density ...

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