Browsing by Subject "Electromagnetic pulse"

Browsing by Subject "Electromagnetic pulse"

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  • Kreitlow, M.; Sabath, F.; Garbe, Heyno (Göttingen : Copernicus GmbH, 2015)
    Ethernet connections, which are widely used in many computer networks, can suffer from electromagnetic interference. Typically, a degradation of the data transmission rate can be perceived as electromagnetic disturbances ...
  • Weng, T.; Stegemann, S.; John, Werner; Mathis, Wolfgang (Göttingen : Copernicus GmbH, 2013)
    In this contribution, a system identification procedure of a two-input Wiener model suitable for the analysis of the disturbance behavior of integrated nonlinear circuits is presented. The identified block model is comprised ...
  • Briest, Niklas; Garbe, Heyno; Potthast, Stefan (Berlin : Walter de Gruyter, 2017)
    The verification of transversal electromagnetic (TEM) waveguides, especially GTEM cells, is described in the standard IEC 61000-4-20 in the frequency and time domain. The verification in time domain is based on a nuclear ...
  • Korte, S.; Garbe, Heyno (Göttingen : Copernicus GmbH, 2006)
    The breakdown behavior of electronics exposed to single transient electromagnetic pulses is subject of investigations for several years. State-of-the-art pulse generators additionally provide the possibility to generate ...
  • Briest, Niklas; Hamann, David; Garbe, Heyno; Potthast, Stefan (Piscataway, NJ : Institute of Electrical and Electronics Engineers Inc., 2017)
    Transverse electromagnetic (TEM) waveguides are predominantly used for emission and immunity tests. General requirements for TEM waveguides are given by the IEC 61000-4-20. Annex C of the IEC 61000-4-20 specifies immunity ...
  • Peikert, Tim; Garbe, Heyno; Potthast, Stefan (Piscataway, NJ : Institute of Electrical and Electronics Engineers Inc., 2017)
    This paper introduces a procedural method based on the fuzzy logic and set theory, which analyzes the risk of an IT-System in a facility and its surrounding area. The method analyzes the susceptibility of an electronic ...
  • Freytag, Felix; Booker, Philip; Corradi, Gabor; Messerschmidt, Simon; Krampf, Andreas; Imlau, Mirco (Washington, DC : Optical Society of America, 2018)
    Femtosecond-pulse-induced (Epump = 2:5 eV) picosecond infrared absorption is studied in the spectral region between 0.30 eV and 1.05 eV in LiNbO3:Mg. We find a noninstantaneous mid-infrared absorption peak in the time ...
  • Pabst, Stefan; Lein, Manfred; Wörner, Hans Jakob (College Park, MD : American Physical Society, 2016)
    Strong-field ionization (SFI) has been shown to prepare wave packets with few-femtosecond periods. Here, we explore whether this technique can be extended to the attosecond time scale. We introduce an intuitive model, which ...
  • Peikert, Tim; Garbe, Heyno; Potthast, S. (Göttingen : Copernicus GmbH, 2016)
    This paper introduces a procedural method based on fuzzy logic to analyze systematic the risk of an electronic system in an intentional electromagnetic environment (IEME). The method analyzes the susceptibility of a complex ...
  • Herlemann, H.; Korte, S.; Camp, M.; Garbe, Heyno; Koch, M.; Sabath, F. (Göttingen : Copernicus GmbH, 2005)
    In order to protect electronic systems against the effects of transient electromagnetic interferences, shields made of electrically conductive material can be used. The subject of this paper is an electrically conductive ...
  • Camp, M.; Garbe, Heyno (Göttingen : Copernicus GmbH, 2004)
    In this paper the susceptibility of personal computer systems to fast transient electromagnetic pulses with double exponential pulse shapes (EMP, UWB) is determined. The influence of the computer generation, RAM-values, ...