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Browsing by Subject "Design for testability"

Now showing items 1-7 of 7

Calibration-measurement unit for the automation of vector network analyzer measurements

Rolfes, I.; Will, B.; Schiek, B. (Göttingen : Copernicus GmbH, 2008)

With the availability of multi-port vector network analyzers, the need for automated, calibrated measurement facilities increases. In this contribution, a calibrationmeasurement unit is presented which realizes a repeatable ...
Contactless electromagnetic measuring system using conventional calibration algorithms to determine scattering parameters

Zelder, T.; Rabe, H.; Eul, H. (Göttingen : Copernicus GmbH, 2007)

In this paper, a contactless measuring system for the determination of the S-parameters of planar circuits is presented. With a contactless measuring system it is possible to characterise a device-under-test (DUT) embedded ...
CrysXPP: An explainable property predictor for crystalline materials

Das, Kishalay; Samanta, Bidisha; Goyal, Pawan; Lee, Seung-Cheol; Bhattacharjee, Satadeep; Ganguly, Niloy (London : Nature Publ. Group, 2022)

We present a deep-learning framework, CrysXPP, to allow rapid and accurate prediction of electronic, magnetic, and elastic properties of a wide range of materials. CrysXPP lowers the need for large property tagged datasets ...
Methods for the calibrated measurement of the scattering parameters of planar multi-port devices

Rolfes, I.; Schiek, B. (Göttingen : Copernicus GmbH, 2007)

In this article, the error-corrected determination of complex scattering parameters of multi-port devices by means of a 2-port vector network analyzer is presented. As only two ports of the device under test can be connected ...
Simulation in thin film technology

Turowski, Marcus; Jupé, Marco; Ehlers, Henrik; Melzig, Thomas; Pflug, Andreas; Ristau, Detlev (Bellingham, WA : S P I E - International Society for Optical Engineering, 2015)

Simulation and modeling find more and more their way into thin film technology. Beside theoretical models for layer design, pre-production design analysis, and real time process control, atomistic simulation techniques ...
Der testfreundliche Entwurf asynchroner Schaltungen

Schöber, Volker (Hannover : Universität, 2001)

[no abstract]
Tuning the optical properties of the metal-organic framework UiO-66 via ligand functionalization

Treger, Marvin; Hannebauer, Adrian; Schaate, Andreas; Budde, Jan L.; Behrens, Peter; Schneider, Andreas M. (Cambridge : RSC Publ., 2023)

Metal-organic frameworks (MOFs) are a promising class of materials for optical applications, especially due to their modular design which allows fine-tuning of the relevant properties. The present theoretical study examines ...

Now showing items 1-7 of 7

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Browsing by Subject "Design for testability"

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