Auflistung nach Schlagwort "AFM"

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  • Multi-terminal magnetotransport measurements over a tunable graphene p-n junction created by AFM-nanomachining 
    Schmidt, H.; Smirnov, D.; Rode, J.; Haug, Rolf J. (College Park, MD : American Institute of Physics, 2013)
    An Atomic Force Microscope is used to alter one part of a single layer graphene sample locally. Transport experiments at low temperatures are then used to characterize the different parts independently with field effect ...
  • Nanomachining of mesoscopic electronic devices using an atomic force microscope 
    Schumacher, Hans W.; Keyser, U.F.; Zeitler, U.; Haug, Rolf J.; Eberl, K. (College Park, MD : American Institute of Physics, 1999)
    An atomic force microscope (AFM) is used to locally deplete the two-dimensional electron gas (2DEG) of a GaAs/AlGaAs heterostructure. The depletion is induced by repeated mechanical scribing of the surface layers of the ...
  • SEM and AFM studies of two-phase magnetic alkali borosilicate glasses 
    Andreeva, N.; Tomkovich, M.; Naberezhnov, Alexander; Nacke, Bernard; Filimonov, Alexey; Alekseeva, O.; Vanina, P.; Nizhankovskii, Viktor (New York, NY : Hindawi Publishing Corporation, 2017)
    The morphology and composition of four types of two-phase alkali borosilicate glasses with magnetic atoms prepared by inductive melting have been studied. The results of scanning electron microscopy point to uniform ...