Micke, P.; Kuehn, S.; Buchauer, L.; Harries, J. R.; Buecking, T.M.; Blaum, K.; Cieluch, A.; Egl, A.; Hollain, D.; Kraemer, S.; Pfeifer, T.; Schmidt, P. O.; Schuessler, R.X.; Schweiger, C.; Stoehlker, T.; Sturm, S.; Wolf, R. N.; Bernitt, S.; Lopez-Urrutia, J.R. Crespo
(College Park : American Institute of Physics (AIP), 2018)
Electron beam ion traps (EBITs) are ideal tools for both production and study of highly charged ions (HCIs). In order to reduce their construction, maintenance, and operation costs, we have developed a novel, compact, ...