Characterization of crystalline silicon based on measurements of the photoluminescence emission

Original version

Herlufsen, Sandra: Characterization of crystalline silicon based on measurements of the photoluminescence emission. Hannover : Gottfried Wilhelm Leibniz Universität Hannover, Diss, 2013, 165 S.

Repository version

To cite the version in the repository, please use this identifier: https://doi.org/10.15488/8084

Files in this item

Thumbnail
Name: 773570209.pdf
Size: 23.13Mb
Format: PDF
View/Open
Abstract:
[no abstract]
License of this version: Es gilt deutsches Urheberrecht. Das Dokument darf zum eigenen Gebrauch kostenfrei genutzt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden.
Publication type: DoctoralThesis
Publishing status: publishedVersion
Publication date: 2013
Keywords german: Ladungsträgerlebensdauer, Photolumineszenz, Silicium
Keywords english: Charge carrier lifetime, photoluminescence, silicon
DDC: 530 | Physik

Usage Statistics

Show full item record

This item appears in the following Collection(s):

 

Search the repository


Browse

My Account

Usage Statistics