In this paper, a contactless measuring system for the determination of the S-parameters of planar circuits is presented. With a contactless measuring system it is possible to characterise a device-under-test (DUT) embedded ...

This paper shows a new method to determine the input impedance of RFID transponder antennas with a combination of on-wafer-prober and network analyzer. It is shown that the results are in a good agreement with FEM simulations ...