Webering, Fritz; Payá Vayá, Guillermo; Aditya, Evan; Dürre, Jan Christoph; Blume, Holger Christoph
(Dutch Research Council (NWO) : Den Haag, 2017)
This paper presents a newly developed integrated
heating system, which can keep the IC under test at a constant
temperature of up to 250 ◦C. The heating system can be used
while the IC under test is mounted on its ...